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 High-Purity metal 每 Ga > 99.9999%  
For wafer doping process and epi growth. We are available to supply many kinds of custom-made form according to different demand ( ex. jar, lump, #.etc. ). The details are as shown follows
Element
Result(ppb)
Element
Result(ppb)
Element
Result(ppb)
Li
0.2
Cr
0.4
In
1
Be
0.2
Mn
0.2
Sn
5
B
0.6
Fe
1.5
Sb
1
Na
0.3
Co
0.1
Te
1.5
Mg
0.2
Ni
0.3
Ba
3
Al
0.3
Cu
1
La
0.5
Si
1.5
Zn
1.5
W
0.6
P
0.5
Ge
25
Pt
1
S
1.8
As
2
Au
5
Cl
2
Se
6
Hg
5
K
5
Sr
2
Tl
0.5
Ca
8
Zr
0.5
Pb
0.8
Sc
0.06
Mo
0.7
Bi
1
Ti
0.1
Ag
50
Th
0.1
V
0.08
Cd
7
U
0.1
 High-Purity metal 每 Ag > 99.99% 
For semiconductor thin-film process. We are available to supply many kinds of custom-made form according to different demand ( ex. slug, target, #.etc. ). The details are as shown follows 每
Element
Result(ppm)
Al
<10
Cr
<6
Cu
<12
Fe
<11
Si
<2
 High-Purity metal 每 Al > 99.999%
For semiconductor thin-film process. We are available to supply many kinds of custom-made form according to different demand ( ex. slug, target, #.etc. ). The details are as shown follows 每
Element
Result(ppm)
Element
Result(ppm)
Cu
<0.5
Si
<0.4
Fe
<0.6
Ti
<0.3
Ga
<0.4
V
<0.6
Mg
<0.6
Zn
<0.6
Mn
<0.3
   
 High-Purity metal 每 Ti > 99.995%
For semiconductor thin-film process. We are available to supply many kinds of custom-made form according to different demand ( ex. slug, target, #.etc. ). The details are as shown follows 每
Element
Result(ppm)
Element
Result(ppm)
Al
3.5
Nb
< 2
Ca
<1
Ni
5.4
Cd
<1
Si
4.2
Cr
5.5
V
2.1
Fe
8.7
Zr
5
Hg
< 1
 GaP wafer
For producing LED substrate. Brief specification as shown follows --
Type
N
Dopant
S
Orientation
(111) +/- 0.5∼

TOP
BOTTOM
Carrier
Concentration (1/cm-3)
3.75 x 1017
5.94 x 1017
Hall Mobility (cm2/V.sec.)
123
120
Dislocation Density (1/cm2)
1.67 x 105
1.88 x 105
Diameter
49.0 ~ 53.0 mm
Thickness
285 +/- 15 um
 GaAs wafer
For producing LED substrate.
Comparison sheet for three kinds of wafer growthing method
VGF
LEC
HB
Wafer Size
2"~6"
3"~6"
~2.5"
Etch Density
Very low
High
Low
Residual Strain
Very low
High
Low
Carbon Control
Good
Good

-
Stoichiometry / EL2 Control
Good
Moderate
Poor
GaAs wafer specification (Semi-conducting & Semi-Insulating)
Semi-conducting GaAs wafers
Parameter
Unit
Diameter
2"
3"
100mm
Growth Method
VGF
VGF
VGF
Dopant
Si
Si
Si
Conductivity type
N
N
N
Carrier Concentration
/cm3
(0.1~4) x 1018
(0.1~4) x 1018
(0.1~4) x 1018
Resistivity
次-cm
(15~1) x 10-3
(15~1) x 10-3
(15~1) x 10-3
Mobility
cm2/Vs
(3.5~1.5) x 103
(3.5~1.5) x 103
(3.5~1.5) x 103
Etch Pit Density
/cm2
<500
<500
<500
Diameter
mm
50.8 +/- 0.5
76.2 +/- 0.5
100 +/- 0.5
Thickness
um
(240~400) +/- 25
(300~625) +/- 25
625 +/- 25
Orientation ﹛
(100) +/- 0.5∼
(100) +/- 0.5∼
(100) +/- 0.5∼
Off Orientation ﹛
Upon Request
Major flat length
mm
16 +/- 15
22.2 +/- 1.5
32 +/- 1.5
Minor flat length
mm
7 +/- 1.5
11.2 +/- 1.5
18 +/- 1.5
TTV
um
5
5
5
TIR
um
5
5
5
Bow
um
5
5
5
Warp
um
5
5
5
Polished surface
P/P, P/E, As-cut
Semi-Insulating GaAs wafers
Parameter
Unit
Diameter
2"
3"
100mm
Growth Method
VGF
VGF
VGF
Dopant
C or Undoped
C or Undoped
C or Undoped
Carrier Concentration
/cm3
N/A
N/A
N/A
Resistivity
次-cm
>1 x 107
>1 x 107
>1 x 107
Mobility
cm2/Vs
>6000
>6000
>6000
Etch Pit Density
/cm2
<5000
<5000
<5000
Diameter
mm
50.8 +/- 0.5
76.2 +/- 0.5
100 +/- 0.5
Thickness
um
(300~450) +/- 25
(350~625) +/- 25
625 +/- 25
Orientation ﹛
(100) +/- 0.5∼
(100) +/- 0.5∼
(100) +/- 0.5∼
Off Orientation ﹛
Upon Request
Major flat length
mm
16 +/- 15
22.2 +/- 1.5
32 +/- 1.5
Minor flat length
mm
7 +/- 1.5
11.2 +/- 1.5
18 +/- 1.5
TTV
um
3
4
4
TIR
um
3
4
4
Bow
um
2
3
3
Warp
um
4
3
3
Polished surface
P/P, P/E, As-cut
 Al2O3 wafer ( Sapphire )
For producing LED substrate. Brief specification as shown follows --
Material
Al2O3
Diameter
50.8 +/- 0.25 mm
Thickness
330 +/- 25 um
430 +/- 25 um
Orientation
C-axis (0001) +/- 0.3∼
Orientation Flat
A-axis (1120) +/- 0.5∼
Surface
Epi-Ready Polished
TTV
< 10 um
BOW
< 10 um
 Au Bonding Wire
For packaging & wiring. Brief specification as shown follows 每
DIA
Property at Room Temp
Property at High Temp
MIL
um
Breaking Load(gr)
Elongation(%)
Breaking Load(gr)
Elongation(%)
0.8
20.0
4.0~8.0
2.0~6.0
2 Min
0.5 Min
6.0~10.0
2.0~7.0
4 Min
0.5 Min
6.0~10.0
3.0~7.0
4 Min
0.5 Min
7.0~11.0
2.0~7.0
5 Min
0.5 Min
6.0~10.0
3.0~7.0
5 Min
0.5 Min
6.0~10.0
3.0~7.0
5 Min
0.5 Min
0.9
23.0
5.0~10.0
2.0~6.0
3 Min
0.5 Min
7.0~11.0
3.0~7.0
5 Min
0.5 Min
7.0~11.0
3.0~7.0
5 Min
0.5 Min
7.0~12.0
2.0~7.0
6 Min
0.5 Min
8.0~11.0
3.0~7.0
6 Min
0.5 Min
8.0~11.0
3.0~7.0
6 Min
0.5 Min
1.0
25.0
8.0~12.0
2.0~6.0
4 Min
0.5 Min
9.0~13.0
3.0~8.0
6 Min
0.5 Min
9.0~13.0
3.0~8.0
6 Min
0.5 Min
10.0~15.0
3.0~8.0
8 Min
0.5 Min
10.0~14.0
3.0~8.0
8 Min
0.5 Min
10.0~14.0
3.0~8.0
8 Min
0.5 Min
1.2
30.0
12.0~16.0
3.0~8.0
6 Min
0.5 Min
14.0~18.0
4.0~10.0
8 Min
0.5 Min
14.0~18.0
4.0~10.0
8 Min
0.5 Min
15.0~19.0
3.0~9.0
13 Min
0.5 Min
15.0~19.0
3.0~10.0
13 Min
0.5 Min
15.0~19.0
3.0~10.0
12 Min
0.5 Min
1.3
33.0
14.0~19.0
3.0~8.0
7 Min
1.0 Min
15.0~21.0
4.0~11.0
10 Min
1.0 Min
15.0~22.0
4.0~11.0
10 Min
1.0 Min
18.0~28.0
3.0~10.0
15 Min
1.0 Min
18.0~26.0
4.0~11.0
13 Min
1.0 Min
18.0~26.0
4.0~11.0
13 Min
1.0 Min
1.5
38.0
18.0~28.0
3.0~10.0
9 Min
1.0 Min
20.0~30.0
5.0~11.0
12Min
1.0 Min
20.0~30.0
5.0~11.0
12 Min
1.0 Min
25.0~35.0
4.0~10.0
18 Min
1.0 Min
24.0~35.0
5.0~11.0
15 Min
1.0 Min
24.0~35.0
5.0~11.0
15 Min
1.0 Min
2.0
50.0
30.0~45.0
3.0~12.0
-
-
35.0~45.0
6.0~15.0
24 Min
1.0 Min
35.0~47.0
6.0~15.0
24 Min
1.0 Min
40.0~52.0
5.0~15.0
-
-
40.0~50.0
5.0~15.0
-
-
40.0~50.0
5.0~15.0
-
-
Besides the above specifications, we are available to supply other types, upon customer's request.
Copyright (C)1996-2005 Gredmann Group.- All rights reserved.